Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs
نویسندگان
چکیده
منابع مشابه
Direct Sampling Methodology for Statistical Analysis of Scaled CMOS Technologies
The continued scaling of CMOS technologies introduces new difficulties to statistical circuit analysis and invalidates many of the methodologies developed earlier. The analysis of device parameter distributions reveals multiple sources of parameter correlations, some of which exhibit mutually opposing trends. We found that applying principal component analysis (PCA) to such heterogeneous statis...
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ژورنال
عنوان ژورنال: ACM Transactions on Design Automation of Electronic Systems
سال: 2012
ISSN: 1084-4309,1557-7309
DOI: 10.1145/2071356.2071365